Characterization of defects in X-ray topography using simulation methods
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چکیده
منابع مشابه
Synchrotron radiation x-ray topography of crystallographic defects in GaN
Aalto University, P.O. Box 11000, FI-00076 Aalto www.aalto.fi Author Sakari Sintonen Name of the doctoral dissertation Synchrotron radiation x-ray topography of crystallographic defects in GaN Publisher School of Electrical Engineering Unit Department of Microand Nanosciences Series Aalto University publication series DOCTORAL DISSERTATIONS 187/2014 Field of research Nanotechnology Manuscript s...
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ژورنال
عنوان ژورنال: Acta Crystallographica Section A Foundations of Crystallography
سال: 1987
ISSN: 0108-7673
DOI: 10.1107/s0108767387080127